Reliability analysis of spin transfer torque based look up tables under process variations and NBTI aging
نویسندگان
چکیده
منابع مشابه
Reliability analysis of spin transfer torque based look up tables under process variations and NBTI aging
Article history: Received 23 September 2015 Received in revised form 1 March 2016 Accepted 1 March 2016 Available online 2 May 2016 Spin transfer torque (STT) switching realized using a magnetic tunnel junction (MTJ) device has shown great potential for low power and non-volatile storage. A prime application of MTJs is in building non-volatile look up tables (LUT) used in reconfigurable logic. ...
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ژورنال
عنوان ژورنال: Microelectronics Reliability
سال: 2016
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2016.03.003