Reliability analysis of spin transfer torque based look up tables under process variations and NBTI aging

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Reliability analysis of spin transfer torque based look up tables under process variations and NBTI aging

Article history: Received 23 September 2015 Received in revised form 1 March 2016 Accepted 1 March 2016 Available online 2 May 2016 Spin transfer torque (STT) switching realized using a magnetic tunnel junction (MTJ) device has shown great potential for low power and non-volatile storage. A prime application of MTJs is in building non-volatile look up tables (LUT) used in reconfigurable logic. ...

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ژورنال

عنوان ژورنال: Microelectronics Reliability

سال: 2016

ISSN: 0026-2714

DOI: 10.1016/j.microrel.2016.03.003